Open AccessGamma prior distribution selection for Bayesian analysis of failure rate and reliability
Author(s) -
R.A. Waller,
Marvin M. Johnson,
Waterman,
Harry F. Martz
Publication year - 1976
Language(s) - English
Resource type - Reports
DOI - 10.2172/7299878
Subject(s) - percentile , lambda , failure rate , gamma distribution , exponential distribution , reliability (semiconductor) , prior probability , mathematics , bayesian probability , conjugate prior , statistics , distribution (mathematics) , computer science , physics , mathematical analysis , optics , power (physics) , quantum mechanics