Open AccessTime-of-flight atom-probe field-ion microscope for the study of defects in metals. Report No. 2357. [W--25 at. % Re]
Author(s) -
Timothy M. Hall,
A. Wagner,
Arnold S. Berger,
D. N. Seidman
Publication year - 1975
Language(s) - English
Resource type - Reports
DOI - 10.2172/7188316
Subject(s) - field ion microscope , ion , microscope , electron multiplier , analytical chemistry (journal) , materials science , atom probe , optics , chemistry , physics , transmission electron microscopy , organic chemistry , chromatography