Analysis of effects of impurities intentionally incorporated into silicon. Final report, Feburary 1, 1977--December 1, 1977
Author(s) -
F. M. Uno
Publication year - 1977
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/7152746
Subject(s) - impurity , scrap , silicon , group (periodic table) , materials science , optoelectronics , chemistry , metallurgy , organic chemistry
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