Open AccessBayesian Zero-Failure (BAZE) reliability demonstration testing procedure and its application to a Rankine dynamic radioisotope power conversion system
Author(s) -
H. F. Martz,
Ray A. Waller
Publication year - 1976
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/7140632
Subject(s) - reliability (semiconductor) , degree rankine , reliability engineering , component (thermodynamics) , computer science , failure rate , bayesian probability , power (physics) , engineering , process engineering , artificial intelligence , thermodynamics , physics
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