Response of multilayer films and mirrors to intense x-irradiation
Author(s) -
Bruce A. Watson,
D. Kohler,
Jeffrey L. Guttman
Publication year - 1984
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/7058767
Subject(s) - fluence , irradiation , materials science , reflection (computer programming) , optics , reflectivity , thin film , radiation damage , degradation (telecommunications) , radiation , nanotechnology , physics , nuclear physics , telecommunications , computer science , programming language
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