Open AccessMECL delay and wiring tests for MECL 10000
Author(s) -
M. Milman
Publication year - 1980
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/6902713
Subject(s) - enhanced data rates for gsm evolution , electronic circuit , signal edge , signal (programming language) , capacitor , electrical engineering , computer science , physics , engineering , telecommunications , voltage , digital signal processing , analog signal , programming language
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