Beta backscatter measurements of aluminum ion plating on U-0. 75 Ti parts | Zendy

K.W. Dolan | Zendy

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Beta backscatter measurements of aluminum ion plating on U-0. 75 Ti parts

Author(s) -

K.W. Dolan

Publication year - 1980

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/6901853

Subject(s) - backscatter (email) , materials science , aluminium , uranium , beta (programming language) , plating (geology) , curvature , ion , radiation , beta particle , optics , radiochemistry , metallurgy , geology , physics , chemistry , telecommunications , geometry , mathematics , geophysics , wireless , quantum mechanics , computer science , programming language

The beta-backscatter method of measuring thin laminates on thick substrates was evaluated for possible production inspection applications of aluminum ion plating on U-0.75 Ti parts. The choice of radiation source, the effects of surface curvature, and background radiation from uranium isotopes were examined. Measurements of aluminum coatings on U-0.75 Ti test coupons and cylindrical parts were made with the ..beta..-backscatter technique and compared to ..cap alpha..-transmission measurements.

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