Environmental scanning electron microscope (ESEM). Final report | Zendy

A. R. Marder | Zendy; Katayun Barmak | Zendy; David J. Williams | Zendy

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Environmental scanning electron microscope (ESEM). Final report

Author(s) -

A. R. Marder,

Katayun Barmak,

David J. Williams

Publication year - 1998

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/676882

Subject(s) - environmental scanning electron microscope , instrumentation (computer programming) , scanning electron microscope , electron microscope , nanotechnology , materials science , computer science , optics , physics , composite material , operating system

The Environmental Scanning Electron Microscope (ESEM) was acquired by a grant from the Department of Energy University Research Instrumentation Program and matching funds from Lehigh University and industry. The equipment is installed as part of the electron microscopy laboratories and is being utilized on a regular basis. Over 20 graduate and undergraduate students from the Department of Materials Science and Engineering as well as other department in the University have included this instrument in their research. In addition, the ESEM has been used in several courses including MAT 427 -- Advanced Scanning Electron Microscopy, a graduate course offered every other year. Examples are given of how the ESEM has been included in the research programs

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