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EBIC and HVTEM studies of RTR silicon ribbon
Author(s) -
B. Cunningham,
H. P. Strunk,
D. G. Ast
Publication year - 1981
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/6580416
Subject(s) - ribbon , recrystallization (geology) , materials science , grain boundary , stacking , impurity , silicon , crystallographic defect , crystallography , laser , condensed matter physics , optoelectronics , optics , microstructure , metallurgy , composite material , chemistry , geology , physics , paleontology , organic chemistry

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