Thin-source concentration dependent diffusion
Author(s) -
G. Eng
Publication year - 1978
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/6549185
Subject(s) - diffusion , impurity , vacancy defect , analytical chemistry (journal) , penetration (warfare) , atmospheric temperature range , chemistry , diffusion process , tracer , materials science , crystallography , thermodynamics , physics , chromatography , innovation diffusion , knowledge management , organic chemistry , operations research , computer science , nuclear physics , engineering
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