
Automated monitoring of thin film capacitors for electrical breakdown
Author(s) -
Ralf Horn
Publication year - 1979
Language(s) - English
Resource type - Reports
DOI - 10.2172/6443256
Subject(s) - capacitor , sensitivity (control systems) , film capacitor , electrical engineering , materials science , noise (video) , optoelectronics , electronic engineering , computer science , engineering , voltage , artificial intelligence , image (mathematics)