Open AccessAssembly Test Chip Version 01 description and users manual
Author(s) -
J.N. Sweet,
D. W. Peterson,
M.R. Tuck,
D.J. Renninger
Publication year - 1990
Language(s) - English
Resource type - Reports
DOI - 10.2172/6432269
Subject(s) - chip , variety (cybernetics) , conductor , van der pauw method , line (geometry) , test data , computer science , engineering , engineering drawing , electrical engineering , materials science , geometry , mathematics , composite material , programming language , artificial intelligence , hall effect , electrical resistivity and conductivity