Open AccessDevice physics of thin-film polycrystalline cells and modules. Annual subcontract report, December 6, 1993--December 5, 1994
Author(s) -
J. R. Sites
Publication year - 1995
Language(s) - English
Resource type - Reports
DOI - 10.2172/64200
Subject(s) - crystallite , thin film , materials science , laser , series (stratigraphy) , optoelectronics , voltage , optics , engineering physics , engineering , electrical engineering , physics , nanotechnology , geology , paleontology , metallurgy
Progress has been made in several applications of device physics to thin-film polycrystalline cells and modules. At the cell level, results include a more quantitative separation of photon losses, the impact of second barriers on cell operation, and preliminary studies of how current-voltage curves are affected by band offsets. Module analysis includes the effects of the typical monolithic, series-connected cell geometry, analytical techniques when only the two module leads are accessible, and the impact of chopping frequency, local defects, and high-intensity beams on laser-scanning measurements