Device physics of thin-film polycrystalline cells and modules. Annual subcontract report, December 6, 1993--December 5, 1994 | Zendy

J. R. Sites | Zendy

Open Access

Device physics of thin-film polycrystalline cells and modules. Annual subcontract report, December 6, 1993--December 5, 1994

Author(s) -

J. R. Sites

Publication year - 1995

Language(s) - English

Resource type - Reports

DOI - 10.2172/64200

Subject(s) - crystallite , thin film , materials science , laser , series (stratigraphy) , optoelectronics , voltage , optics , engineering physics , engineering , electrical engineering , physics , nanotechnology , geology , paleontology , metallurgy

Progress has been made in several applications of device physics to thin-film polycrystalline cells and modules. At the cell level, results include a more quantitative separation of photon losses, the impact of second barriers on cell operation, and preliminary studies of how current-voltage curves are affected by band offsets. Module analysis includes the effects of the typical monolithic, series-connected cell geometry, analytical techniques when only the two module leads are accessible, and the impact of chopping frequency, local defects, and high-intensity beams on laser-scanning measurements

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