
Determination of pseudogap state density and carrier mobility in rf sputtered amorphous silicon. Final technical report, July 1, 1979-June 30, 1980
Author(s) -
William Paul,
David Anderson,
Richard L. Weisfield
Publication year - 1980
Language(s) - English
Resource type - Reports
DOI - 10.2172/6419168
Subject(s) - pseudogap , amorphous silicon , condensed matter physics , semiconductor , silicon , amorphous solid , field (mathematics) , density of states , materials science , amorphous semiconductors , work (physics) , physics , computational physics , chemistry , thermodynamics , crystalline silicon , optoelectronics , mathematics , superconductivity , crystallography , cuprate , pure mathematics