z-logo
open-access-imgOpen Access
Determination of pseudogap state density and carrier mobility in rf sputtered amorphous silicon. Final technical report, July 1, 1979-June 30, 1980
Author(s) -
W. Paul
Publication year - 1980
Language(s) - English
Resource type - Reports
DOI - 10.2172/6419168
Subject(s) - pseudogap , amorphous silicon , condensed matter physics , semiconductor , silicon , amorphous solid , field (mathematics) , density of states , materials science , amorphous semiconductors , work (physics) , physics , computational physics , chemistry , thermodynamics , crystalline silicon , optoelectronics , mathematics , superconductivity , crystallography , cuprate , pure mathematics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom