
An experimental measurement of metal multilayer x-ray reflectivity degradation due to intense x-ray flux
Author(s) -
M. Y. P. Hockaday
Publication year - 1987
Language(s) - English
Resource type - Reports
DOI - 10.2172/6345752
Subject(s) - tungsten , materials science , neon , plasma , molybdenum , analytical chemistry (journal) , optics , streak camera , specular reflection , atomic physics , chemistry , argon , laser , physics , metallurgy , quantum mechanics , chromatography