
A computer model for analyzing low-yield threshold test ban treaties
Author(s) -
Richard Bradford,
P.R. Sokkappa
Publication year - 1990
Language(s) - English
Resource type - Reports
DOI - 10.2172/6337102
Subject(s) - treaty , ratification , computer science , false accusation , yield (engineering) , operations research , econometrics , risk analysis (engineering) , law , political science , economics , mathematics , business , materials science , politics , metallurgy