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Use of axially symmetric electrostatic fields for ion-beam focussing
Author(s) -
E. Colton,
J. C. Kelly
Publication year - 1983
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/6306279
Subject(s) - microprobe , axial symmetry , radius , atomic physics , electric field , coaxial , ion , beam (structure) , ion beam , charged particle , field (mathematics) , physics , materials science , optics , nuclear physics , computer security , mathematics , quantum mechanics , computer science , pure mathematics , electrical engineering , engineering

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