Open AccessParticle detection by secondary electron emission from low-density KCl. [100 to 1000 MeV]
Author(s) -
R. P. DiNardo
Publication year - 1978
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/6276266
Subject(s) - secondary emission , secondary electrons , electron , resolution (logic) , electron density , detector , particle (ecology) , atomic physics , layer (electronics) , yield (engineering) , chemistry , materials science , analytical chemistry (journal) , physics , optics , nanotechnology , nuclear physics , oceanography , artificial intelligence , computer science , metallurgy , geology , chromatography
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