Open AccessMicroprocessor-based scan control unit for electron and photon beams used in surface analysis
Author(s) -
Steven J. Haney
Publication year - 1979
Language(s) - English
Resource type - Reports
DOI - 10.2172/6257603
Subject(s) - control unit , microprobe , microprocessor , horizontal scan rate , beam (structure) , electrical engineering , computer hardware , optics , engineering , materials science , computer science , physics , nuclear physics , cyclic voltammetry , electrode , quantum mechanics , electrochemistry , operating system