Open AccessStructure and electrical activity of planar defects in EFG ribbons. First quarterly report, January 1--March 31, 1979
Author(s) -
D. G. Ast
Publication year - 1979
Language(s) - English
Resource type - Reports
DOI - 10.2172/6220417
Subject(s) - planar , electron beam induced current , transmission electron microscopy , materials science , crystallographic defect , silicon , impurity , crystallography , electron microscope , dislocation , condensed matter physics , optoelectronics , optics , chemistry , nanotechnology , physics , organic chemistry , computer graphics (images) , computer science
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