Open AccessMicrocomputer enhanced optical investigation of spreading and evaporative processes in ultra thin films
Author(s) -
Peter Wayner,
M. SUJANANI,
A.H. Liu
Publication year - 1990
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/6175898
Subject(s) - ellipsometry , curvature , optics , thin film , materials science , wetting , meniscus , line (geometry) , heat transfer , evaporation , contact angle , measure (data warehouse) , mechanics , nanotechnology , composite material , computer science , physics , thermodynamics , geometry , mathematics , incidence (geometry) , database
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