Open AccessMeasurement of roughness-induced wavelength corrections to the surface plasmon resonance in silver
Author(s) -
J. A. Bush,
David Cohen,
K.D. Scherkoske,
S. O. Sari
Publication year - 1979
Language(s) - English
Resource type - Reports
DOI - 10.2172/6103978
Subject(s) - surface plasmon resonance , wavelength , surface roughness , surface finish , materials science , resonance (particle physics) , optics , annealing (glass) , reflectivity , surface plasmon , plasmon , optoelectronics , atomic physics , physics , nanotechnology , composite material , nanoparticle
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