Open AccessSoftware reliability models for critical applications
Author(s) -
Hoang Pham,
M. Pham
Publication year - 1991
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/6017897
Subject(s) - software quality , reliability (semiconductor) , reliability engineering , software reliability testing , computer science , software , verification and validation , software construction , avionics software , software engineering , software development , software sizing , engineering , operating system , power (physics) , operations management , physics , quantum mechanics
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