Dimensionality and its effects upon the valence electronic structure of ordered metallic systems
Author(s) -
James Tobin
Publication year - 1983
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/6001358
Subject(s) - overlayer , monolayer , synchrotron radiation , angle resolved photoemission spectroscopy , valence (chemistry) , low energy electron diffraction , brillouin zone , auger electron spectroscopy , electronic structure , x ray photoelectron spectroscopy , chemistry , materials science , photon energy , electron diffraction , atomic physics , crystallography , molecular physics , diffraction , condensed matter physics , photon , optics , nuclear magnetic resonance , nanotechnology , physics , computational chemistry , organic chemistry , nuclear physics
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