Open AccessInfrared interferometric thickness measurement of polymeric thin films and coatings
Author(s) -
N.R. Smyrl
Publication year - 1979
Language(s) - English
Resource type - Reports
DOI - 10.2172/5998090
Subject(s) - materials science , tin , coating , electrical conductor , deposition (geology) , thin film , semiconductor , thermometer , optics , scattering , interferometry , composite material , optoelectronics , metallurgy , thermodynamics , nanotechnology , physics , paleontology , sediment , biology