Open AccessMicrocomputer enhanced optical investigation of spreading and evaporative processes in ultra thin films
Author(s) -
Peter Wayner,
A.H. Liu
Publication year - 1991
Language(s) - English
Resource type - Reports
DOI - 10.2172/5897804
Subject(s) - ellipsometry , materials science , refractive index , wetting , thin film , optics , isothermal process , meniscus , contact angle , heat transfer , composite material , optoelectronics , nanotechnology , mechanics , physics , thermodynamics , incidence (geometry)
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