Open AccessStudy of defects and radiation damage in solids by field-ion and atom-probe microscopy
Author(s) -
D. N. Seidman
Publication year - 1979
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5895339
Subject(s) - field ion microscope , tungsten , ion , atom probe , atom (system on chip) , microscope , atomic physics , field (mathematics) , materials science , radiation damage , microscopy , radiation , nanotechnology , optics , chemistry , physics , metallurgy , transmission electron microscopy , mathematics , organic chemistry , computer science , pure mathematics , embedded system
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