Open AccessMeasurement of multilayer mirror reflectivity and stimulated emission in the XUV spectral region
Author(s) -
C. J. Keane,
Chang Hee Nam,
Lewis D. Meixler,
H. M. Milchberg,
C.H. Skinner,
S. Suckewer,
D. Voorhees,
Troy W. Barbee
Publication year - 1986
Language(s) - English
Resource type - Reports
DOI - 10.2172/5876017
Subject(s) - extreme ultraviolet , reflectivity , materials science , optics , line (geometry) , silicon , plasma , molybdenum , emission spectrum , spectral line , optoelectronics , atomic physics , physics , laser , geometry , mathematics , quantum mechanics , astronomy , metallurgy