Open AccessSpitzer or neoclassical resistivity: A comparison between measured and model poloidal field profiles on PBX-M
Author(s) -
S.M. Kaye,
R. Hatcher,
R. Kaita,
C. Kessel,
B.P. LeBlanc,
D. McCune,
Samit Paul,
F. M. Levinton
Publication year - 1992
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5871797
Subject(s) - electrical resistivity and conductivity , physics , plasma , resistive touchscreen , magnetic field , diffusion , line (geometry) , field line , field (mathematics) , computational physics , pitch angle , diffusion equation , thermodynamics , nuclear physics , geometry , geophysics , quantum mechanics , mathematics , pure mathematics , electrical engineering , engineering , economy , service (business) , economics
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