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High-temperature complementary metal oxide semiconductors (CMOS)
Author(s) -
J. D. McBrayer
Publication year - 1979
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/5762395
Subject(s) - cmos , reliability (semiconductor) , materials science , stability (learning theory) , silicon , operating temperature , semiconductor , metal , optoelectronics , oxide , electronic engineering , electrical engineering , computer science , engineering , metallurgy , physics , thermodynamics , power (physics) , machine learning

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