(Synchrotron studies of x-ray reflectivity from surfaces)
Author(s) -
P.S. Pershan
Publication year - 1992
Language(s) - English
Resource type - Reports
DOI - 10.2172/5659960
Subject(s) - scattering , auger , optics , salient , x ray photoelectron spectroscopy , ellipsometry , period (music) , x ray optics , materials science , physics , x ray , computer science , nanotechnology , atomic physics , thin film , artificial intelligence , nuclear magnetic resonance , acoustics
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