X-ray microdiffraction studies of an integrated laser-modulator system | Zendy

W. Rodrigues | Zendy; Z. Cai | Zendy; Wenrong Yun | Zendy; H.R. Lee | Zendy; P. Ilinski | Zendy; E. Isaacs | Zendy; J. Grenko | Zendy

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X-ray microdiffraction studies of an integrated laser-modulator system

Author(s) -

W. Rodrigues,

Z. Cai,

Wenrong Yun,

H.R. Lee,

P. Ilinski,

E. Isaacs,

J. Grenko

Publication year - 1997

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/555519

Subject(s) - spatial light modulator , monochromatic color , optics , laser , superlattice , beam (structure) , materials science , flux (metallurgy) , zone plate , diffraction , physics , photon , resolution (logic) , optoelectronics , artificial intelligence , computer science , metallurgy

The authors report the use of a spatially resolved x-ray microdiffraction technique for the structural study of an integrated laser-modulator system. The monochromatic (11 keV) x-ray beam microfocused to less than 1 {micro}m in the vertical direction was obtained using a phase zone plate. The photon flux at the focal spot exceeded 3 {times} 10{sup 10} photons/s/0.01% bw/{micro}m{sup 2}. The intense flux density and high spatial resolution of the focused beam was used to study the structure of a laser-modulator system, which is a 1-{micro}m-wide and 1-mm-long multi-quantum well structure on an InP substrate. The superlattice d-spacing and the strain field in the direction normal to the diffracting planes were mapped as a function of position along the length of the device

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