Reliability analysis of containment isolation systems
Author(s) -
P.J. Pelto,
Kevin Ames,
Raymond Hv Gallucci
Publication year - 1985
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/5535425
Subject(s) - unavailability , containment (computer programming) , reliability (semiconductor) , reliability engineering , licensee , engineering , computer science , isolation (microbiology) , power (physics) , physics , license , microbiology and biotechnology , quantum mechanics , biology , programming language , operating system
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom