
Extreme ultraviolet and soft x-ray diagnostics of high-temperature plasmas
Author(s) -
W. Moos
Publication year - 1986
Language(s) - English
Resource type - Reports
DOI - 10.2172/5504298
Subject(s) - spectrograph , extreme ultraviolet lithography , plasma diagnostics , tokamak , extreme ultraviolet , plasma , instrumentation (computer programming) , zeeman effect , physics , spectral line , magnetic field , materials science , optics , computer science , nuclear physics , astronomy , laser , quantum mechanics , operating system