Open AccessPhysical models of thin film polycrystalline solar cells based on measured grain-boundary and electronic-parameter properties. Quarterly report
Author(s) -
F.A. Lindholm,
J.G. Fossum,
Paul Holloway,
A. Neugroschel
Publication year - 1979
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5439720
Subject(s) - grain boundary , polycrystalline silicon , passivation , solar cell , materials science , photovoltaic system , consistency (knowledge bases) , crystallite , optoelectronics , engineering physics , silicon , computer science , nanotechnology , physics , electrical engineering , composite material , engineering , microstructure , layer (electronics) , artificial intelligence , metallurgy , thin film transistor
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