Open AccessPreparation and characterization of superlattices
Author(s) -
I.K. Schuller
Publication year - 1992
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5430644
Subject(s) - reflection high energy electron diffraction , electron diffraction , auger electron spectroscopy , superlattice , characterization (materials science) , diffraction , materials science , molecular beam epitaxy , low energy electron diffraction , thin film , engineering physics , nanotechnology , optics , optoelectronics , epitaxy , physics , layer (electronics) , nuclear physics
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