z-logo
open-access-imgOpen Access
Ion implantation of boron in germanium
Author(s) -
K. S. Jones
Publication year - 1985
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5425716
Subject(s) - acceptor , ion implantation , boron , annealing (glass) , germanium , analytical chemistry (journal) , materials science , ion , vacancy defect , crystallographic defect , deep level transient spectroscopy , silicon , irradiation , radiochemistry , atomic physics , crystallography , chemistry , optoelectronics , metallurgy , physics , nuclear physics , condensed matter physics , organic chemistry , chromatography

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom