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Secondary electron yields of carbon-coated and polished stainless steel
Author(s) -
D. Ruzic,
R.W. Moore,
D. Manos,
S. Cohen
Publication year - 1982
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5388339
Subject(s) - electropolishing , materials science , polishing , secondary electrons , scanning electron microscope , analytical chemistry (journal) , auger electron spectroscopy , microprobe , electron microprobe , metallurgy , graphite , carbon fibers , bismuth , secondary emission , electron , composite material , electrode , mineralogy , chemistry , physics , quantum mechanics , chromatography , composite number , nuclear physics , electrolyte

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