X-ray microscope assemblies. Final report and metrology report
Author(s) -
T. Zehnpfennig
Publication year - 1981
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Slovenian
Resource type - Reports
DOI - 10.2172/5259129
Subject(s) - optics , metrology , microscope , reflection (computer programming) , physics , materials science , computer science , programming language
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