(Defect studies in III-V thin film semiconductors)
Author(s) -
D. G. Ast
Publication year - 1991
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/5189768
Subject(s) - semiconductor , materials science , thin film , optoelectronics , nanotechnology
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