Energetic neutral beam cleaning. Final CRADA report for CRADA number Y-1296-0427
Author(s) -
D. E. Schechter,
C. C. Tsai,
C. A. Boitnott
Publication year - 1996
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/515581
Subject(s) - wafer , beam (structure) , microwave , materials science , particle beam , nuclear engineering , atomic physics , optoelectronics , optics , physics , engineering , telecommunications
The purpose of this project is to evaluate the feasibility of cleaning silicon wafers with an energetic (1 to 100 eV) neutral particle beam and to develop a viable neutral beam source. A microwave plasma source on an existing test stand was modified to produce a 2-cm diameter neutral beam for cleaning the wafers. Significant results regarding neutral beam wafer cleaning are reported
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