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Single-electron charging effects
Author(s) -
S. T. Ruggiero
Publication year - 1991
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/5152751
Subject(s) - quantum tunnelling , scanning tunneling microscope , scanning tunneling spectroscopy , key (lock) , electron , spin polarized scanning tunneling microscopy , nanotechnology , physics , engineering physics , materials science , computer science , condensed matter physics , nuclear physics , computer security

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