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Profile correction to electron temperature and enhancement factor in soft x-ray pulse-height-analysis measurements in tokamaks
Author(s) -
S. Šesnić,
M. Diesso,
K. W. Hill,
Anthony S. Holland,
F. Pohl
Publication year - 1988
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5119656
Subject(s) - electron temperature , electron , atomic physics , electron density , physics , spectral line , distortion (music) , ansatz , radiation , optics , computational physics , analytical chemistry (journal) , chemistry , nuclear physics , amplifier , optoelectronics , cmos , chromatography , quantum mechanics , astronomy

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