Laser based sub-picosecond electron bunch characterization using 90{degree} Thomson scattering | Zendy

Wim Leemans | Zendy; P. Volfbeyn | Zendy; M. Zolotorev | Zendy

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Laser based sub-picosecond electron bunch characterization using 90{degree} Thomson scattering

Author(s) -

Wim Leemans,

P. Volfbeyn,

M. Zolotorev

Publication year - 1997

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Reports

DOI - 10.2172/505356

Subject(s) - laser beam quality , optics , beam parameter product , m squared , beam diameter , beam divergence , beam (structure) , thomson scattering , laser , picosecond , cathode ray , scattering , femtosecond , rayleigh length , physics , transverse plane , electron , laser beams , nuclear physics , structural engineering , engineering

X-rays produced by 90{degree} Thomson scattering of a femtosecond, near infrared, terawatt laser pulse off a 50 MeV electron beam are shown to be an effective diagnostic to measure transverse and longitudinal density distributions of an electron beam (e-beam) with subpicosecond time resolution. The laser beam was focused onto the e-beam waist, generating 30 keV x-rays in the forward direction. The transverse and longitudinal e-beam structure have been obtained by measuring the intensity of the x-ray beam, while scanning the laser beam across the e-beam in space and time. The e-beam divergence has been obtained through measurement of spatial and spectral characteristics of the scattered x-ray beam

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