Open AccessX-ray measurements of stresses and defects in EFG and large grained polycrystalline silicon ribbons. First quarterly report
Author(s) -
C. N. J. Wagner
Publication year - 1978
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5014871
Subject(s) - goniometer , silicon , materials science , crystallite , x ray , crystallography , optics , optoelectronics , physics , chemistry , metallurgy
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