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LIFE TEST ON FOUR ELECTRICALLY-HEATED THERMIONIC DIODES WITH FLUORIDE VAPOR- DEPOSITED TUNGSTEN EMITTERS.
Author(s) -
D. M. Ernst,
C. Pezaris
Publication year - 1969
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/4731125
Subject(s) - thermionic emission , tungsten , materials science , diode , optoelectronics , electrical engineering , metallurgy , engineering , physics , electron , quantum mechanics

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