Open AccessSolid state physics program. The origins of stress in thin nickel films
Author(s) -
Frank Anthony Doljack
Publication year - 1971
Language(s) - English
Resource type - Reports
DOI - 10.2172/4725764
Subject(s) - materials science , full width at half maximum , pulsed laser deposition , thin film , layer (electronics) , buffer (optical fiber) , transmission electron microscopy , doping , analytical chemistry (journal) , ternary operation , optoelectronics , nanotechnology , chemistry , telecommunications , chromatography , computer science , programming language