Open AccessDIRECT OBSERVATION OF POINT DEFECTS IN IRRADIATED OR QUENCHED METALS BY QUANTITATIVE FIELD ION MICROSCOPY.
Author(s) -
D. N. Seidman
Publication year - 1972
Language(s) - English
Resource type - Reports
DOI - 10.2172/4601042
Subject(s) - ion , irradiation , field ion microscope , vacancy defect , atomic physics , platinum , crystallographic defect , atom (system on chip) , analytical chemistry (journal) , materials science , chemistry , crystallography , physics , nuclear physics , biochemistry , organic chemistry , chromatography , computer science , embedded system , catalysis