Open AccessCORRECTIONS FOR X-RAY INTENSITY DATA OBTAINED FROM ELECTRON MICROPROBES
Author(s) -
R. K. Hart
Publication year - 1965
Language(s) - English
Resource type - Reports
DOI - 10.2172/4577285
Subject(s) - beamline , pseudomonas fluorescens , contamination , penetration depth , penetration (warfare) , materials science , nanotechnology , analytical chemistry (journal) , mineralogy , chemistry , optics , geology , environmental chemistry , physics , bacteria , ecology , paleontology , biology , beam (structure) , engineering , operations research