Open AccessSurface film thickness determination by reflectivity measurements.
Author(s) -
D.T. Larson,
L. A. Lott,
D. L. Cash
Publication year - 1972
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/4567868
Subject(s) - reflectivity , materials science , surface (topology) , optics , mathematics , geometry , physics
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